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Influence of top electrode deposition conditions on the reliability of integrated SBT ferroelectric capacitors
Publication:
Influence of top electrode deposition conditions on the reliability of integrated SBT ferroelectric capacitors
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Goux, Ludovic
;
Xu, Zhen
;
Paraschiv, Vasile
;
Schwitters, M.
;
Lisoni, Judit
;
Maes, David
;
Haspeslagh, Luc
;
Groeseneken, Guido
;
Zambrano, R.
;
Wouters, Dirk
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2025
since deposited on 2021-10-15
Acq. date: 2026-01-26
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Views
2025
since deposited on 2021-10-15
Acq. date: 2026-01-26
Citations