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Influence of the antireflection coating on the electromigration resistance of 0.5 µm technology metal-2 line structures

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1 since deposited on 2021-09-29
Acq. date: 2026-01-09

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1979 since deposited on 2021-09-29
Acq. date: 2026-01-09

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1 since deposited on 2021-09-29
Acq. date: 2026-01-09

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1979 since deposited on 2021-09-29
Acq. date: 2026-01-09

Citations