Publication:
Negative bias temperature instabilities in HfSiON/TaN-based pMOSFETs
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1851 since deposited on 2021-10-15
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Acq. date: 2026-08-05
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Views
1851 since deposited on 2021-10-15
2last month
2last week
Acq. date: 2026-08-05
Citations