dc.contributor.author | Houssa, Michel | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Stesmans, Andre | |
dc.date.accessioned | 2021-10-15T13:57:11Z | |
dc.date.available | 2021-10-15T13:57:11Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9066 | |
dc.source | IIOimport | |
dc.title | Defect generation in high-k gate dielectric stacks under electrical stress: the impact of hydrogen | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Houssa, Michel | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Stesmans, Andre | |
dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
dc.source.peerreview | no | |
dc.source.conference | CECAM Workshop on Atomic Processes at Semiconductor-Oxide Interfaces in Microelectronics Devices | |
dc.source.conferencedate | 13/09/2004 | |
dc.source.conferencelocation | Lyon France | |
imec.availability | Published - imec | |