Publication:
Influence of an accumulation back-gate voltage on the low-frequency noise spectra of 0.13 μm fully-depleted SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers
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1974 since deposited on 2021-10-15
Acq. date: 2026-03-17
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Statistics
Views
1974 since deposited on 2021-10-15
Acq. date: 2026-03-17
Citations