Microstructural characterization of side walls in SBT 3D capacitors
dc.contributor.author | Menou, N. | |
dc.contributor.author | Goux, Ludovic | |
dc.contributor.author | Lisoni, Judit | |
dc.contributor.author | Schwitters, M. | |
dc.contributor.author | Turquat, Ch. | |
dc.contributor.author | Madigou, V. | |
dc.contributor.author | Hodeau, J-L. | |
dc.contributor.author | Muller, Ch. | |
dc.contributor.author | Wouters, Dirk | |
dc.date.accessioned | 2021-10-15T14:48:42Z | |
dc.date.available | 2021-10-15T14:48:42Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9285 | |
dc.source | IIOimport | |
dc.title | Microstructural characterization of side walls in SBT 3D capacitors | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.source.peerreview | no | |
dc.source.conference | 16th International Symposium on Integrated Ferroelectrics | |
dc.source.conferencedate | 5/04/2004 | |
dc.source.conferencelocation | ||
imec.availability | Published - imec | |
imec.internalnotes | Best poster award |
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