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Shallow trench isolation dimensions effects on leakage current and doping concentration of advanced p-n junction diodes
Publication:
Shallow trench isolation dimensions effects on leakage current and doping concentration of advanced p-n junction diodes
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Poyai, A.
;
Rittaporn, I.
;
Simoen, Eddy
;
Claeys, Cor
;
Rooyackers, Rita
Journal
Materials Science and Engineering B
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1873
since deposited on 2021-10-15
Acq. date: 2025-12-16
Citations
Metrics
Views
1873
since deposited on 2021-10-15
Acq. date: 2025-12-16
Citations