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Investigation and suppression of the gate disturb effect in source side injection flash EEPROM arrays
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Authors
Van Houdt, Jan
;
Wellekens, Dirk
;
Vanhorebeek, Guido
;
Haspeslagh, Luc
;
Deferm, Ludo
;
Groeseneken, Guido
;
Maes, Herman
Conference
25th European Solid State Device Research Conference - ESSDERC
Title
Investigation and suppression of the gate disturb effect in source side injection flash EEPROM arrays
Publication type
Proceedings paper
Embargo date
9999-12-31
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