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Investigation and suppression of the gate disturb effect in source side injection flash EEPROM arrays

dc.contributor.authorVan Houdt, Jan
dc.contributor.authorWellekens, Dirk
dc.contributor.authorVanhorebeek, Guido
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorDeferm, Ludo
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T13:19:51Z
dc.date.available2021-09-29T13:19:51Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/947
dc.sourceIIOimport
dc.titleInvestigation and suppression of the gate disturb effect in source side injection flash EEPROM arrays
dc.typeProceedings paper
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.imecauthorDeferm, Ludo
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage553
dc.source.endpage556
dc.source.conference25th European Solid State Device Research Conference - ESSDERC
dc.source.conferencedate25/09/1995
dc.source.conferencelocationDen Haag The Netherlands
imec.availabilityPublished - open access


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