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A comprehensive model for breakdown mechanism in HfO2 high-k gate stacks
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A comprehensive model for breakdown mechanism in HfO2 high-k gate stacks
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ranjan, R.
;
Pey, K.L.
;
Tung, C.H.
;
Tang, L.J.
;
Groeseneken, Guido
;
Bera, L.K.
;
De Gendt, Stefan
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2068
since deposited on 2021-10-15
Acq. date: 2025-12-14
Citations
Metrics
Views
2068
since deposited on 2021-10-15
Acq. date: 2025-12-14
Citations