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Analysing impact of MOSFET oxide breakdown by small- and large-signal HF measurements
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Analysing impact of MOSFET oxide breakdown by small- and large-signal HF measurements
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schreurs, Dominique
;
Pantisano, Luigi
;
Kaczer, Ben
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1930
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-09
Citations
Metrics
Views
1930
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-09
Citations