A Low-Frequency Noise Study of Hot-Carrier Stressing Effects in Submicron Si p-MOSFETs

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Authors
Vasina, Petr; Sikula, J.; Simoen, Eddy; Claeys, C.
Conference
2nd ELEN Workshop; October 25-27, 1995; Grenoble, France.
Title
A Low-Frequency Noise Study of Hot-Carrier Stressing Effects in Submicron Si p-MOSFETs
Publication type
Oral presentation
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