dc.contributor.author | Vandevelde, Bart | |
dc.contributor.author | Gonzalez, Mario | |
dc.contributor.author | Limaye, Paresh | |
dc.contributor.author | Ratchev, Petar | |
dc.contributor.author | Vanfleteren, Jan | |
dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2021-10-15T17:26:54Z | |
dc.date.available | 2021-10-15T17:26:54Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9831 | |
dc.source | IIOimport | |
dc.title | Lead free solder joint reliability estimation by finite element modelling, advantages, challenges and limitations | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vandevelde, Bart | |
dc.contributor.imecauthor | Gonzalez, Mario | |
dc.contributor.imecauthor | Vanfleteren, Jan | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Vandevelde, Bart::0000-0002-6753-6438 | |
dc.contributor.orcidimec | Vanfleteren, Jan::0000-0002-9654-7304 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.source.peerreview | no | |
dc.source.conference | 7th IPC International Conference on Lead Free Electronic Components and Assemblies | |
dc.source.conferencedate | 21/10/2004 | |
dc.source.conferencelocation | Frankfurt Germany | |
imec.availability | Published - imec | |
imec.internalnotes | Proceedings on CD-ROM | |