Authors

Vermeulen, Tom; Yao, Thierry; Lowe, Antony; Cacharelis, Philippe; Degraeve, Robin; Van Houdt, Jan

Conference

Proceedings of the 34th European Solid-State Device Research Conference - ESSDERC

Title

Failure rate predictions for 0.35μm flash EEPROM memories from accelerated read disturb tests

Publication type

Proceedings paper