Publication:
Failure rate predictions for 0.35μm flash EEPROM memories from accelerated read disturb tests
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1994 since deposited on 2021-10-15
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Acq. date: 2025-10-24
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1994 since deposited on 2021-10-15
449item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations