NMOS transistor behaviour under CDM stress conditions and relation to other ESD models
dc.contributor.author | Verhaege, Koen | |
dc.contributor.author | Luchies, J. M. | |
dc.contributor.author | Russ, Christian | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Kuper, F. | |
dc.date.accessioned | 2021-09-29T13:24:14Z | |
dc.date.available | 2021-09-29T13:24:14Z | |
dc.date.issued | 1995 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/992 | |
dc.source | IIOimport | |
dc.title | NMOS transistor behaviour under CDM stress conditions and relation to other ESD models | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 117 | |
dc.source.endpage | 125 | |
dc.source.conference | Proceedings of the 6th ESREF Conference | |
dc.source.conferencedate | 3/10/1995 | |
dc.source.conferencelocation | Bordeaux France | |
imec.availability | Published - open access |