Publication:

A study of relaxation current in high-k gate stacks

Date

2004-03

Journal article

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Author(s)

Xu, Zhen

;

Pantisano, Luigi

;

Kerber, Andreas

;

Degraeve, Robin

;

Cartier, Eduard

;

De Gendt, Stefan

;

;

Groeseneken, Guido

Journal

IEEE Trans. Electron Devices

Statistics

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Acq. date: 2026-02-28