Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Microstructure and resistivity characterization of CuAu I superlattice formed in Cu/Au thin films
Publication:
Microstructure and resistivity characterization of CuAu I superlattice formed in Cu/Au thin films
Copy permalink
Date
2004
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Wenqi
;
Brongersma, Sywert
;
Richard, Olivier
;
Brijs, Bert
;
Palmans, Roger
;
Froyen, Ludo
;
Maex, Karen
Journal
Journal of Vacuum Science and Technology B
Abstract
Description
Metrics
Views
2018
since deposited on 2021-10-15
Acq. date: 2025-12-10
Citations
Metrics
Views
2018
since deposited on 2021-10-15
Acq. date: 2025-12-10
Citations