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Microstructure and resistivity characterization of CuAu I superlattice formed in Cu/Au thin films
Publication:
Microstructure and resistivity characterization of CuAu I superlattice formed in Cu/Au thin films
Date
2004
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Wenqi
;
Brongersma, Sywert
;
Richard, Olivier
;
Brijs, Bert
;
Palmans, Roger
;
Froyen, Ludo
;
Maex, Karen
Journal
Journal of Vacuum Science and Technology B
Abstract
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2015
since deposited on 2021-10-15
424
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Metrics
Views
2015
since deposited on 2021-10-15
424
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations