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Influence of the electron mean free path on the resistivity of thin metal films
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Influence of the electron mean free path on the resistivity of thin metal films
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Wenqi
;
Brongersma, Sywert
;
Richard, Olivier
;
Brijs, Bert
;
Palmans, Roger
;
Froyen, Ludo
;
Maex, Karen
Journal
Microelectronic Engineering
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1902
since deposited on 2021-10-15
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Acq. date: 2025-12-09
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Metrics
Views
1902
since deposited on 2021-10-15
1
last month
1
last week
Acq. date: 2025-12-09
Citations