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Comparison of modulus and density measurements by nanoidentation, SAWS, XRR and EP techniques of a porous low k MSQ dielectric
Publication:
Comparison of modulus and density measurements by nanoidentation, SAWS, XRR and EP techniques of a porous low k MSQ dielectric
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Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Abell, Thomas
;
Iacopi, Francesca
;
Prokopowicz, Greg
;
Sun, Brad
;
Mazurenko, Alex
;
Travaly, Youssef
;
Baklanov, Mikhaïl
;
Jonas, Alain
;
Sullivan, Chris
;
Brongersma, Sywert
;
Liou, Huey-Chiang
;
Tower, Josua
;
Gostein, Michael
;
Gallagher, Mike
;
Calvert, Jeff
;
Moinpour, Mansour
;
Maex, Karen
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1891
since deposited on 2021-10-16
1
last month
Acq. date: 2026-08-04
Citations