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Enter the following information to request a copy for the following item: Improvement in NBTI reliability of Si-passivated Ge/high-k/metal-gate pFETs
Requesting the following file: 18683.pdf
Enter the following information to request a copy for the following item: Improvement in NBTI reliability of Si-passivated Ge/high-k/metal-gate pFETs
Requesting the following file: 18683.pdf