Publication:
Improvement in NBTI reliability of Si-passivated Ge/high-k/metal-gate pFETs
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1837 since deposited on 2021-10-17
1last month
1last week
Acq. date: 2026-02-25
Citations
Statistics
Views
1837 since deposited on 2021-10-17
1last month
1last week
Acq. date: 2026-02-25
Citations