Publication:
Improvement in NBTI reliability of Si-passivated Ge/high-k/metal-gate pFETs
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1840 since deposited on 2021-10-17
3last month
Acq. date: 2026-04-05
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Statistics
Views
1840 since deposited on 2021-10-17
3last month
Acq. date: 2026-04-05
Citations