Publication:
Improvement in NBTI reliability of Si-passivated Ge/high-k/metal-gate pFETs
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1833 since deposited on 2021-10-17
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Acq. date: 2025-12-15
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1833 since deposited on 2021-10-17
1last month
1last week
Acq. date: 2025-12-15
Citations