Analysis and Application of a Surface Admittance Operator for Combined Magnetic and Dielectric Contrast in Emerging Interconnect Topologies

Bosman, Dries; Huynen, Martijn; De Zutter, Daniel; Sun, Xiao; Pantano, Nicolas; Van Der Plas, Geert; Beyne, Eric; Ginste, Dries Vande

doi:10.1109/TMTT.2023.3244205

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