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Analysis and Application of a Surface Admittance Operator for Combined Magnetic and Dielectric Contrast in Emerging Interconnect Topologies
Publication:
Analysis and Application of a Surface Admittance Operator for Combined Magnetic and Dielectric Contrast in Emerging Interconnect Topologies
Date
2023
Journal article
https://doi.org/10.1109/TMTT.2023.3244205
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7.48 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bosman, Dries
;
Huynen, Martijn
;
De Zutter, Daniel
;
Sun, Xiao
;
Pantano, Nicolas
;
Van Der Plas, Geert
;
Beyne, Eric
;
Ginste, Dries Vande
Journal
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
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1184
since deposited on 2023-03-18
Acq. date: 2025-10-28
Citations
Metrics
Views
1184
since deposited on 2023-03-18
Acq. date: 2025-10-28
Citations