Request a copy of the file
Enter the following information to request a copy for the following item: Characterization of negative-bias temperature instability of Ge MOSFETs with GeO2/Al2O3 stack
Requesting the following file: 27504.pdf
Enter the following information to request a copy for the following item: Characterization of negative-bias temperature instability of Ge MOSFETs with GeO2/Al2O3 stack
Requesting the following file: 27504.pdf