Request a copy of the file
Enter the following information to request a copy for the following item: Bias-temperature instability of Si and Si(Ge)-channel sub-1nm EOT p-MOS devices: challenges and solutions
Requesting the following file: 27198.pdf
Enter the following information to request a copy for the following item: Bias-temperature instability of Si and Si(Ge)-channel sub-1nm EOT p-MOS devices: challenges and solutions
Requesting the following file: 27198.pdf