Publication:
Bias-temperature instability of Si and Si(Ge)-channel sub-1nm EOT p-MOS devices: challenges and solutions
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1956 since deposited on 2021-10-21
Acq. date: 2026-02-28
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Statistics
Views
1956 since deposited on 2021-10-21
Acq. date: 2026-02-28
Citations