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Enter the following information to request a copy for the following item: Superior NBTI reliability of SiGe channel pMOSFETs: replacement Gate, FinFETs, and impact of body bias
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Enter the following information to request a copy for the following item: Superior NBTI reliability of SiGe channel pMOSFETs: replacement Gate, FinFETs, and impact of body bias
Requesting the following file: 22903.pdf