Publication:
Superior NBTI reliability of SiGe channel pMOSFETs: replacement Gate, FinFETs, and impact of body bias
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1843 since deposited on 2021-10-19
2last month
Acq. date: 2025-12-16
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Metrics
Views
1843 since deposited on 2021-10-19
2last month
Acq. date: 2025-12-16
Citations