Publication:

Superior NBTI reliability of SiGe channel pMOSFETs: replacement Gate, FinFETs, and impact of body bias

Date

2011

Proceedings Paper

Simple item page Full metadata Statistics

Files

22903.pdf 662 KB

Author(s)

;

;

;

Roussel, Philippe

;

;

;

Ragnarsson, Lars-Ake

;

;

Witters, Liesbeth

;

Chiarella, Thomas

;

Togo, Mitsuhiro

;

;

Hikavyy, Andriy

;

;

Horiguchi, Naoto

;

Groeseneken, Guido

Statistics

1846 since deposited on 2021-10-19

Acq. date: 2026-04-06