Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
Nanoscale imaging and x-ray spectroscopy of electrically active defects in ultra thin dielectrics on silicon
Statistics
Statistics by Category
Download view's map
PNG
JPEG/JPG
Reports
Most viewed
Most viewed per month
Top city views
File Visits
Export Excel
Export CSV
Item
Views
Nanoscale imaging and x-ray spectroscopy of electrically active defects in ultra thin dielectrics on silicon
1343