Browsing by Author "Afanas'ev, V."

Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO2 with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier Stacking

Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy

Energy band alignment in MoS₂/HfO₂: Transfer-related artifacts and interfacial effects

Ge deep sub-micron pFETs with etched TaN metal gate on a High-K dielectric, fabricated in a 200mm silicon prototyping line

Measurement of direct and indirect bandgaps in synthetic ultrathin MoS2 and WS2 films from photoconductivity spectra

Metal gate work function extraction using Fowler-Nordheim tunneling techniques

Multi-step trap-assisted tunneling in Al-doped HfO₂ used in advanced 2.5D metal-insulator-metal capacitors

Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability

Trap-assisted tunneling in high permittivity gate dielectric stacks