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Browsing by Author "Afanas'ev, Valeri V."

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    Analysis of transferred MoS2 layers grown by MOCVD: evidence of Mo vacancy related defect formation

    Schoenaers, Ben  
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    Leonhardt, Alessandra  
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    Nalin Mehta, Ankit  
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    Stesmans, Andre  
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    Chiappe, Daniele
    Journal article
    2020, ECS Journal of Solid State Science and Technology, (9) 9, p.93001
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    Capacitive Memory Window With Non-Destructive Read in Ferroelectric Capacitors

    Mukherjee, Shankha  
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    Bizindavyi, Jasper  
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    Clima, Sergiu  
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    Popovici, Mihaela Ioana  
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    Piao, Xiaoyu  
    Journal article
    2023, IEEE ELECTRON DEVICE LETTERS, (44) 7, p.1092-1095
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    Defect profiling in FEFET Si:HfO2 layers

    O'Sullivan, Barry  
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    Putcha, Vamsi  
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    Izmailov, Roman
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    Afanas'ev, Valeri V.
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    Simoen, Eddy  
    Journal article
    2020, Applied Physics Letters, (117) 20, p.203504
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    Electron spin resonance features of the Ge Pb1 dangling bond defect in condensation-grown (100)Si/SiO2/Si1xGex/SiO2 heterostructures

    Somers, P.
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    Stesmans, Andre  
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    Souriau, Laurent  
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    Afanas'ev, Valeri V.
    Journal article
    2012, Journal of Applied Physics, (112) 7, p.74501
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    Electron trapping in ferroelectric HfO2

    Izmailov, Roman A.
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    Strand, Jack W.
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    Larcher, Luca
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    Shluger, Alexander L.
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    Afanas'ev, Valeri V.
    Journal article
    2021, PHYSICAL REVIEW MATERIALS, (5) 3, p.034415
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    Material-selective doping of 2D TMDC through AlxOy encapsulation

    Leonhardt, Alessandra  
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    Chiappe, Daniele
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    Afanas'ev, Valeri V.
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    El Kazzi, Salim
    ;
    Shlyakhov, Ilya  
    Journal article
    2019, ACS Applied Materials & Interfaces, (11) 45, p.42697-42707

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