Publication:

Defect profiling in FEFET Si:HfO2 layers

Date

2020

Journal article

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Files

46248.pdf 4.01 MB

Author(s)

O'Sullivan, Barry

;

;

Izmailov, Roman

;

Afanas'ev, Valeri V.

;

;

;

Higashi, Yusuke

;

Degraeve, Robin

;

Truijen, Brecht

;

;

;

McMitchell, Sean

;

Banerjee, Kaustuv

;

;

Breuil, Laurent

;

Van den Bosch, Geert

;

Linten, Dimitri

;

Journal

Applied Physics Letters

Metrics

2045 since deposited on 2021-10-29

1last month

Acq. date: 2026-01-10