Browsing by Author "Aichinger, Thomas"
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Publication A two-stage model for negative bias temperature instability
Proceedings paper2009-04, 47th Annual IEEE International Reliability Physics Symposium, 26/04/2009, p.33-44Publication Do NBTI-induced interface states show fast recovery? A study using a corrected on-the-fly charge-pumping measurement technique
Proceedings paper2009-04, 47th Annual IEEE International Reliability Physics Symposium, 26/04/2009, p.1033-1038Publication On the 'permanent' component of NBTI
Proceedings paper2010, IEEE International Integrated Reliability Workshop - IIRW, 17/10/2010, p.2-7Publication Recent advances in understanding the bias temperature instability
Proceedings paper2010-12, IEEE International Electron Devices Meeting - IEDM, 6/12/2010Publication Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noise
Publication The "permanent" component of NBTI: composition and annealing
Publication The paradigm shift in understanding the bias temperature instability: from reaction–diffusion to switching oxide traps
Journal article2011, IEEE Transactions on Electron Devices, (58) 11, p.3652-3666