Browsing by Author "Alioto, Massimo"
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Publication Buried silicon-germanium pMOSFETs: experimental analysis in VLSI logic circuits under aggressive voltage scaling
Journal article2012, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, (20) 8, p.1487-1495Publication Early assessment of emerging technologies for VLSI logic circuits from experimental measurements
Proceedings paper2012, IEEE International Conference on Solid-State and Integrated Circuit Technology - ICSICT, 29/10/2012Publication Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling
Proceedings paper2011, IEEE International Symposium on Circuits and Systems - ISCAS, 15/05/2011, p.2249-2252Publication Understanding the basic advantages of bulk FinFETs for sub- and near-threshold logic from device measurements
Journal article2012, IEEE Transactions on Circuits and Systems II: Express Briefs, (59) 7, p.439-442