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Browsing by Author "Alles, Michael"

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    Radiation effects in advanced multiple-gate and silicon-on-insulator transistors

    Simoen, Eddy  
    ;
    Gaillardin, Marc
    ;
    Paillet, Philippe
    ;
    Reed, Robert
    ;
    Schrimpf, Ron
    ;
    Alles, Michael
    Journal article
    2013, IEEE Transactions on Nuclear Science, (60) 3, p.1970-1991
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    Total ionizing dose effects on strained Ge pMOS FinFETs on bulk Si

    Mitard, Jerome  
    ;
    Zhang, En Xia
    ;
    Fleetwood, Daniel
    ;
    Hachtel, Jordan
    ;
    Liang, Chundong
    ;
    Reed, Robert
    Meeting abstract
    2016-07, IEEE Nuclear Space and Radiation Conference - NSREC, 13/07/2016

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