Publication:

Radiation effects in advanced multiple-gate and silicon-on-insulator transistors

Date

2013
Journal article
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26758.pdf 3.39 MB

Author(s)

Simoen, Eddy  
;
Gaillardin, Marc
;
Paillet, Philippe
;
Reed, Robert
;
Schrimpf, Ron
;
Alles, Michael
;
El-Mamouni, Farah
;
Fleetwood, Daniel
;
Griffoni, Alessio
;
Claeys, Cor

Journal

IEEE Transactions on Nuclear Science

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