Browsing by Author "Amini, E."

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New access to soft breakdown parameters of low k dielectrics through localization-based analysis

Herfurth, Norbert
;
Simon-Najasek, M.
;
Herfurth, R.
;
Hübner, S.
;
Altmann, Frank
;
Beyreuther, A.
Proceedings paper
2019, 2019 IEEE International Reliability Physics Symposium (IRPS), 31/03/2019
Photon emission as a characterization tool for bipolar parasitics in FinFET technology

Beyreuther, A.
;
Herfurth, N.
;
Amini, E.
;
Nakamura, T.
;
De Wolf, Ingrid
;
Boit, C.
Journal article
2018, Microelectronics Reliability, 88-90, p.273-276