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Articles
Photon emission as a characterization tool for bipolar parasitics in FinFET technology
Publication:
Photon emission as a characterization tool for bipolar parasitics in FinFET technology
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Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Beyreuther, A.
;
Herfurth, N.
;
Amini, E.
;
Nakamura, T.
;
De Wolf, Ingrid
;
Boit, C.
Journal
Microelectronics Reliability
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Metrics
Views
1813
since deposited on 2021-10-25
5
last month
1
last week
Acq. date: 2025-12-15
Citations