Browsing by Author "Amoroso, Salvatore"

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Interplay between statistical variability and reliability in contemporary p-MOSFETs: measurements vs. simulated

Hussin, Razaidi
;
Amoroso, Salvatore
;
Gerrer, Louis
;
Kaczer, Ben
;
Weckx, Pieter
;
Franco, Jacopo
Journal article
2014, IEEE Transactions on Electron Devices, (61) 9, p.3265-3273
Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow

Hussin, Razaidi
;
Gerrer, Louis
;
Ding, Jie
;
Wang, Liping
;
Amoroso, Salvatore
;
Cheng, Binjie
Proceedings paper
2015, 45th European Solid State Device Research Conference - ESSDERC, 14/09/2015, p.238-241
TCAD-based methodology for reliability assessment of nanoscaled MOSFETs

Hussin, Razaidi
;
Gerrer, Louis
;
Amoroso, Salvatore
;
Wang, Liping
;
Weckx, Pieter
;
Franco, Jacopo
Proceedings paper
2015, 11th Conference on Ph.D. Research in Microelectronics and Electronics - PRIME, 29/06/2015, p.270-273