Publication:

Interplay between statistical variability and reliability in contemporary p-MOSFETs: measurements vs. simulated

Date

2014

Journal article

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Author(s)

Hussin, Razaidi

;

Amoroso, Salvatore

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;

;

;

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Vanderheyden, Annelies

;

Vanhaeren, Danielle

;

Horiguchi, Naoto

;

Journal

IEEE Transactions on Electron Devices

Statistics

1903 since deposited on 2021-10-22

Acq. date: 2026-02-25