Interplay between statistical variability and reliability in contemporary p-MOSFETs: measurements vs. simulated

dc.contributor.author	Hussin, Razaidi
dc.contributor.author	Amoroso, Salvatore
dc.contributor.author	Gerrer, Louis
dc.contributor.author	Kaczer, Ben
dc.contributor.author	Weckx, Pieter
dc.contributor.author	Franco, Jacopo
dc.contributor.author	Vanderheyden, Annelies
dc.contributor.author	Vanhaeren, Danielle
dc.contributor.author	Horiguchi, Naoto
dc.contributor.author	Asenov, Asen
dc.contributor.imecauthor	Kaczer, Ben
dc.contributor.imecauthor	Weckx, Pieter
dc.contributor.imecauthor	Franco, Jacopo
dc.contributor.imecauthor	Vanhaeren, Danielle
dc.contributor.imecauthor	Horiguchi, Naoto
dc.contributor.orcidimec	Kaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimec	Franco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimec	Vanhaeren, Danielle::0000-0001-8624-9533
dc.contributor.orcidimec	Horiguchi, Naoto::0000-0001-5490-0416
dc.date.accessioned	2021-10-22T02:10:41Z
dc.date.available	2021-10-22T02:10:41Z
dc.date.issued	2014
dc.identifier.issn	0018-9383
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/23975
dc.identifier.url	http://dx.doi.org/10.1109/TED.2014.2336698
dc.source.beginpage	3265
dc.source.endpage	3273
dc.source.issue	9
dc.source.journal	IEEE Transactions on Electron Devices
dc.source.volume	61
dc.title	Interplay between statistical variability and reliability in contemporary p-MOSFETs: measurements vs. simulated
dc.type	Journal article
dspace.entity.type	Publication
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