TCAD-based methodology for reliability assessment of nanoscaled MOSFETs

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Author(s)

Hussin, Razaidi

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Amoroso, Salvatore

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Vanderheyden, Annelies

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Vanhaeren, Danielle

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Horiguchi, Naoto

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Metrics

1923 since deposited on 2021-10-22

Acq. date: 2025-10-27