Publication:

TCAD-based methodology for reliability assessment of nanoscaled MOSFETs

Date

2015

Proceedings Paper

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Files

33152.pdf 756.04 KB

Author(s)

Hussin, Razaidi

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;

Amoroso, Salvatore

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;

;

;

Vanderheyden, Annelies

;

Vanhaeren, Danielle

;

Horiguchi, Naoto

;

;

Metrics

1925 since deposited on 2021-10-22

Acq. date: 2025-12-10