Publication:

TCAD-based methodology for reliability assessment of nanoscaled MOSFETs

Date

2015
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorHussin, Razaidi
dc.contributor.authorGerrer, Louis
dc.contributor.authorAmoroso, Salvatore
dc.contributor.authorWang, Liping
dc.contributor.authorWeckx, Pieter
dc.contributor.authorFranco, Jacopo
dc.contributor.authorVanderheyden, Annelies
dc.contributor.authorVanhaeren, Danielle
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorKaczer, Ben
dc.contributor.authorAsenov, Asen
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorVanhaeren, Danielle
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecVanhaeren, Danielle::0000-0001-8624-9533
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-22T19:47:56Z
dc.date.available2021-10-22T19:47:56Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25405
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7251387
dc.source.beginpage270
dc.source.conference11th Conference on Ph.D. Research in Microelectronics and Electronics - PRIME
dc.source.conferencedate29/06/2015
dc.source.conferencelocationGlasgow UK
dc.source.endpage273
dc.title

TCAD-based methodology for reliability assessment of nanoscaled MOSFETs

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
33152.pdf
Size:
756.04 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions