Browsing by Author "Arora, R."
Now showing 1 - 3 of 3
- Results per page
- Sort Options
Publication Interface and border traps in Ge pMOSFETs
Meeting abstract2012, ECS Fall Meeting Symposium E6: High Purity Silicon 12, 7/10/2012, p.2637Publication Radiation hardness of SiGe and Ge-based CMOS technologies
Proceedings paper2011, 26th Symposium on Microelectronics Technology and Devices - SBMicro, 30/08/2011, p.17-30Publication Total ionizing dose effects on Ge pMOSFETs with high-k gate stack: on/off current ratio
Journal article2009, IEEE Transactions on Nuclear Science, (56) 4, p.1926-1930