Browsing by Author "Baert, Bruno"
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Publication Analysis of the time-dependent electrical current in reverse-biased p-GeSn/n-Ge mesa diodes
Meeting abstract2015-09, E-MRS Fall Symposium O: Alternative Semiconductor Integration in Si Microelectronics: Materials, Techniques and Appl., 14/09/2015Publication Current transients in reverse-biased p-GeSn/n-Ge diodes
Proceedings paper2015, International Conference on Silicon Epitaxy and Heterostructures - ICSI-9, 17/05/2015, p.111-112Publication Electrical characterization of p-GeSn/n-Ge diodes with interface traps under dc and ac regimes
Journal article2015, Solid-State Electronics, 110, p.65-70Publication Electrical characterization of pGeSn/nGe diodes
Proceedings paper2014-06, International Silicon Technology and Device Meeting - ISTDM, 2/06/2014, p.53-54Publication Impact of traps on the electrical characteristics of GeSn/Ge diodes
Meeting abstract2014-09, E-MRS 2014 Fall Meeting Symposium J: Alternative Semiconductor Integration in Si Microelectronics: Materials, Techniques & Appl., 15/09/2014Publication Study of interface trap density in a GeSn MOS structure by numerical simulation of the electrical characteristics
Proceedings paper2013, 8th International conference on Silicon Epitaxy and Heterostructures - ICSI-8, 3/06/2013