Browsing by Author "Bayerl, A."

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A conductive AFM nanoscale analysis of NBTI and channel hot-carriers degradation in MOSFETs

Wu, Qian
;
Bayerl, A.
;
Porti, Marc
;
Martin-Martinez, Javier
;
Lanza, Mario
;
Rodiguez, Rosanna
Journal article
2014, IEEE Transactions on Electron Devices, (61) 9, p.3118-3124
Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale

Bayerl, A.
;
Porti, Marc
;
Martin-Martinez, Javier
;
Lanza, M.
;
Rodriguez, Rosanna
;
Velayudhan, V.
Proceedings paper
2013, IEEE International Reliability Physics Symposium - IRPS, 14/04/2013, p.5D4.1-5D4.6