Browsing by Author "Ben Nissim, S."
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Publication 300mm in-line metrologies for the characterization of ultra-thin layer of 2D materials
Proceedings paper2023, Conference on Metrology, Inspection, and Process Control XXXVII, FEB 27-MAR 02, 2023, p.Art. 124961XPublication Wafer-scale characterization for two-dimensional material layers
Journal article review2024-MAR 1, JAPANESE JOURNAL OF APPLIED PHYSICS, (63) 3, p.030802