Publication:

Wafer-scale characterization for two-dimensional material layers

Date

2024-MAR 1

Journal Article Review

https://doi.org/10.35848/1347-4065/ad26bc

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Author(s)

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Bogdanowicz, Janusz

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Groven, Benjamin

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Beggiato, Matteo

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Charley, Anne-Laure

Journal

JAPANESE JOURNAL OF APPLIED PHYSICS

Metrics

570 since deposited on 2024-03-27

Acq. date: 2025-12-24