Publication:

Wafer-scale characterization for two-dimensional material layers

Date

2024-MAR 1
Journal Article Review
https://doi.org/10.35848/1347-4065/ad26bc
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dc.contributor.authorMoussa, Alain
dc.contributor.authorBogdanowicz, Janusz
dc.contributor.authorGroven, Benjamin
dc.contributor.authorMorin, Pierre
dc.contributor.authorBeggiato, Matteo
dc.contributor.authorSaib, Mohamed
dc.contributor.authorSantoro, G.
dc.contributor.authorAbramovitz, Y.
dc.contributor.authorHouchens, K.
dc.contributor.authorBen Nissim, S.
dc.contributor.authorMeir, N.
dc.contributor.authorHung, J.
dc.contributor.authorUrbanowicz, A.
dc.contributor.authorKoret, R.
dc.contributor.authorTurovets, I.
dc.contributor.authorLee, B.
dc.contributor.authorLee, W. T.
dc.contributor.authorLorusso, Gian
dc.contributor.authorCharley, Anne-Laure
dc.contributor.imecauthorMoussa, A.
dc.contributor.imecauthorBogdanowicz, J.
dc.contributor.imecauthorGroven, B.
dc.contributor.imecauthorMorin, P.
dc.contributor.imecauthorBeggiato, M.
dc.contributor.imecauthorSaib, M.
dc.contributor.imecauthorLorusso, G. F.
dc.contributor.imecauthorCharley, A. -L.
dc.date.accessioned2024-03-27T17:34:17Z
dc.date.available2024-03-27T17:34:17Z
dc.date.issued2024-MAR 1
dc.identifier.doi10.35848/1347-4065/ad26bc
dc.identifier.issn0021-4922
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43737
dc.publisherIOP Publishing Ltd
dc.source.beginpage030802
dc.source.issue3
dc.source.journalJAPANESE JOURNAL OF APPLIED PHYSICS
dc.source.numberofpages7
dc.source.volume63
dc.subject.keywordsTHIN WS2
dc.subject.keywordsMONOLAYER
dc.title

Wafer-scale characterization for two-dimensional material layers

dc.typeJournal article review
dspace.entity.typePublication
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