Browsing by Author "Benfdila, A."
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Publication Assessment of temperature dependence of the low frequency noise in unstrained and strained FinFETs
Proceedings paper2011, 21st International Conference on Noise and Fluctuations - ICNF, 12/06/2011, p.131-134Publication DC and low frequency noise performances of SOI p-FinFETs at very low temperature
;Achour, Hakim ;Talmat, Rachida ;Cretu, Bogdan ;Routoure, Jean-Marc ;Benfdila, A.Carin, RegisJournal article2013, Solid-State Electronics, 90, p.160-165Publication DC and noise performances of SOI FinFETs at very low temperature
Proceedings paper2012, 8th European Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI, 24/01/2012, p.13-14Publication High-temperature characterization of advanced strained nMUGFETs
;Talmat, Rachida ;Put, Sofie; ; ;Claeys, Cor ;Guo, W.Cretu, B.Proceedings paper2010, 6th Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI, 25/01/2010Publication Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy
Journal article2015, Solid-State Electronics, 112, p.1-6Publication In-depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature
;Achour, H. ;Cretu, Bogdan ;Routoure, Jean-Marc ;Carin, Regis ;Talmat, RachidaBenfdila, A.Journal article2014, Solid-State Electronics, 98, p.12-19Publication Low frequency noise characterization in n-channel FinFETs
Journal article2012, Solid-State Electronics, (70) 1, p.20-26Publication Low frequency noise spectroscopy in advanced nFinFETs
Proceedings paper2011, 7th Workshop of the Thematic Network on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI, 17/01/2011, p.55-56Publication Low temperature noise spectroscopy of p-channel SOI FinFETs
Proceedings paper2014, 10th Workshop on the Thematic Network on Silicon on Insulator Technology, Devices and Circuits - EUROSOI, 26/01/2014, p.1-2Publication Performances under saturation operation of p-channel FinFETs on SOI substrates at cryogenic temperature
Proceedings paper2014, CAS International Semiconductor Conference, 13/10/2014, p.181-184